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lunes, 7 de junio de 2021

TEMPERATURE TEST CHAMBER FOR HEAVY SAMPLES IN ELECTRONICS, MODEL: CETM-25/1296e

The electronic samples can be small microchips or large iron blocks, but the size does not matter, as they have to be tested in sub-zero and above-zero temperature conditions to verify their thermal resistance, whether they are small samples or large, heavy samples.

The design of the thermal test chamber CETM-25/1296e is based on the premise of being able to test large heavy specimens up to 750 kg. Its horizontal design allows the specimens to be loaded by means of a bridge crane, with a door large enough for the specimens to be placed safely. Its ergonomic design allows the chamber to be controlled from the side of the chamber, and the front wall pass-throughs allow access to the customer's own sampling probes to be positioned on the sample. 

If you want more information, you can contact us through our email: comercial@dycometal.com or on our website: www.dycometal.com.

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DYCOMETAL company with more than 35 years of experience in the development of chambers for simulation of environmental tests, offers its customers the TERMPERATURE TEST CHAMBER FOR HEAVY SAMPLES to perform such tests.